泰克Tektronix TDP1000探头 深圳发货

名称:泰克Tektronix TDP1000探头 深圳发货

供应商:深圳市世家仪器有限公司

价格:面议

最小起订量:1/台

地址:深圳市南山区桃源街道龙珠光前村内综合楼A2栋301A

手机:13554832690

联系人:梅志伟 (请说在中科商务网上看到)

产品编号:144867936

更新时间:2022-02-08

发布者IP:183.17.236.44

详细说明

  Tektronix TDP1000 全新美国泰克示波器高压差分探头

  The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

  Key performance specifications

  1GHz and 500MHz probe bandwidth

  18dB CMRR (at 250MHz 50X attenuation)

  Key features

  Outstanding electrical performance

  Selectable bandwidth-limiting filters

  DC reject

  Versatile DUT connectivity

  Small compact probe head for probing small geometry circuit elements

  Straight pin, square pin, solder down, variable pitch standard accessories

  Robust design for reliability

  Easy to use

  Provides automatic units scaling and readout on the oscilloscope display

  TDP1000, TDP0500

  Connect directly to oscilloscopes with the TekVPI™ probe interface

  Easy access to scope-displayed probe menu for probe setup control and operating status information

  Remote GPIB/USB probe control through the oscilloscope

  AutoZero – zeros out output offset

  P6251

  Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter

  Applications

  High-speed switch mode power supply design

  CAN/LIN bus design

  Digital design and characterization

  Manufacturing engineering test

  Research and development

  High-voltage differential probes

  The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

  Outstanding Electrical Performance

  Versatile Device-Under-Test Connectivity

  Ease of Use