Reduce Manufacturing Test Time and Accelerate Test Development

　　The Wireless Test System (WTS) helps you to reduce manufacturing test time and accelerate test development to get product to market quickly.

　　A WTS solution offers a powerful combination of fast and industry-leading measurement speed, high port density, wide bandwidth and active integrated DUT switching.

　　Designed for high volume physical layer test in non-signaling test applications, the instrument provides test capabilities for testing multiple antennas, multiple DUTs in parallel and multi-channel RF requirements, such as MIMO or 802.11ac wave 2 & 3. This provides test coverage for all of today and tomorrows connectivity, cellular and internet of things standards.

　　Features

　　Generate and receive RF signals from 65MHz to 6GHz with up to 200 MHz instantaneous bandwidth

　　8 or 16 full duplex RF ports that can be configured for MIMO, multi-standard and multi-DUT testing

　　Chipset automation available

　　Connectivity standards

　　802.11a/b/g/n/ac 80+80 / 160

　　BT / BT LE

　　FM / RDS

　　GNSS

　　Cellular standards

　　LTE / LTE-A

　　WCDMA / HSPA+

　　TD-SCDMA

　　CDMA2000

　　GSM / EDGE