Perform In-Circuit Functional and System Test

　　The 5800 Series is a multi-configuration, multi-functional test system designed to meet the ever-changing needs of today’s electronic manufacturing environment.

　　Features

　　5820 Bench Top

　　The bench top model provides a scalable core system but in a low cost package. Allowing you to start small but grow your test solution. The instrument cards are interfaced to the test fixture by means of interconnectingcabling. As with all the body styles, 3rd party PXI and GPIB controlled instrumentation can be added to further enhance the capabilities of the system. This system can then be effortlessly migrated to a rack-mounted system as your test requirements grow without loss of any previous investment

　　5830 Rack Mount

　　The 5830 Rack Mount model builds the core system into a 19" rack solution for further test flexibility. The cards can then be cabled to an industry standard mass interconnect interface of the user’s choice such as a Virginia PanelTMor MAC panelTMor ECT VG Series (Pylon). The rack mounted system is the easiest platform to integrate additional test resource that is not available in PXI format such as GPIB controlled instrumentation, as it can all be contained within the one unit thus future proofing your test investment.

　　5860 Stand-Alone

　　The 5860 is a floor-standing system that is self-contained and ergonomically designed for high volume production. This compact system is particularly suited to low cost automated in-line fixture applications where its height profile allows for SMEMA compliance. The chassis houses many of the functional components required for a standalone multi-strategy test system:

　　2U 19" Industrial PC

　　Vacuum fixture actuation (optional)

　　Monitor/Keyboard

　　Mains safety and distribution

　　Operators Panel *

　　User Power Supplies *

　　* - Upright system only

　　The tester mass interconnect utilizes the industry leading Virginia PanelTMG12X interface that provides a high density, compact and reliable connection between test system and test subject.

　　Analog in-Circuit test (ICT)

　　Digital Functional test (FCT)

　　High Test Point count

　　Automatic program generation (CAPG)

　　.NET compliant software

　　Boundary Scan and Device Programming

　　Capacitor Polarity and Vectorless Test

　　Future Proof - Infinitely scalable open architecture

　　Graphical development environment

　　Small footprint

　　21 slot PXI backplane for 3U PXI Integration