The 400G CFP8 Module is a scalable test solution based on the latest standard for 400G and 200G Ethernet (IEEE 802.3 bs) and ready for OTUCn. It boasts a CFP8 slot to host the first-generation 400G pluggables, support for upcoming QSFP-DD and OSFP available via adapters. FlexE and FlexO applications are addressed via 5 QSFP28 slots.

　　Anticipating the growing need for speed and accuracy, the 400G CFP8 Module is the newest addition to the VIAVI ONT-600 family. It is a scalable test solution that addresses the complete development cycle ecosystem—from chips to systems. It’s based on the latest standard for 400G/200G Ethernet (IEEE 802.3 bs) and boasts a CFP8 slot to host the first generation 400G pluggables. Electrical adapters are available to directly inter-connect with 400G evaluation boards via 16 * 25G NRZ or 8 * 50G PAM-4.

　　The module’s comprehensive applications allow for in-depth troubleshooting with full insight into the MAC/IP layers using “real world” signals. In addition, advanced error analysis and dynamic skew tests will help quickly identify and analyze issues on the physical layer.

　　As you face increasing demands for speed and reliability, the 400G Module will help you be ready for upcoming OTUCn testing. It supports FlexE and FlexO applications via industry standard QSFP28 ports. Moreover, its FPGA-based design will follow evolving standards, making the VIAVI 400G CFP8 Module a smart investment into the future.

　　Highlights

　　400GE and 200GE Signal Integrity Testing

　　CFP8 Transponder Test (16x25G NRZ)

　　QSFP-DD and OSFP Transponder Test (8x50G PAM-4)

　　Evaluation Board Access via PAM-4 and NRZ adapters

　　Addresses Physical Layer, PCS/FEC, Ethernet and OTN

　　Benefits

　　Comprehensive Applications for Troubleshooting from Physical Layer up to 400GE/OTUC4

　　Future-proof by design, prepared for in-depth FlexE/FlexO Testing

　　Applications

　　400G/200G Testing and Troubleshooting

　　Transponder Testing

　　IC Validation

　　System Integration

　　Key Features

　　Full Bandwidth 400GE and 200GE Testing

　　CFP8 Slot with optional Electrical Interfaces

　　PCS/FEC Layer Testing

　　Dynamic Skew Insertion (NRZ)

　　Access to MDIO Control Interface